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- Thirdly, the structure and morphology of Si nanodot arrays were evaluated by X-ray diffraction spectroscopy (XRD), Fourier transition infrared spectrum (FTIR), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). 利用X射线衍射仪(XRD)、红外吸收谱、拉曼光谱、扫描电子显微镜(SEM)和透射电子显微镜(TEM)等表征手段观察分析了Si纳米晶阵列的微结构及表面形貌。
- Scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction spectroscopy (XRD) and energy dispersive X-ray analysis (EDX) were used to evaluate the structure and composition. 使用扫描电子显微镜(SEM)、透射电子显微镜(TEM)、X射线衍射(XRD)、X射线能量色散分析(EDX)、拉曼光谱(Raman)对样品形貌和结构进行了表征,结果显示:合成的碳纳米管为多壁碳管;
- low-energy electron diffraction spectroscopy 低能电子衍射光谱学
- reflection high energy electron diffraction spectroscopy 反射高能电子衍射能谱
- diffraction spectroscopy 衍射能谱
- Another important wave phenomenon is diffraction. 另一个重要的波现象是衍射。
- To undergo or cause to undergo diffraction. 使衍射产生或导致衍射
- Diffraction, too, occurs in light waves. 衍射也是由光波产生。
- Principles of Fourier Optics and Diffraction. 傅立叶光学和衍射原理。
- The formation of NiSi is demonstrated by X-ray diffraction and Raman scattering spectroscopy. X射线衍射和喇曼散射谱分析表明在各种样品中都形成了NiSi.
- Means of mensuration of polyiodides are various and X-ray diffraction, Raman and far-IR spectroscopy are primary methods for the characterization of polyiodides. 高居碘的测试手段多样，主要的有X-射线衍、拉曼光谱和远红外光谱。
- The uncertainty principle can account for diffraction. 测不准原理可以说明衍射。
- The parity of atomic states is important in spectroscopy. 原子状态的宇称性质在光谱中是重要的。
- Lustre is the integral effect of reflection and diffraction. 色泽是反射和衍射的综合效果。
- The Ti-doped WO_3 films were characterized with X-ray diffraction (XRD),Raman spectroscopy,ultraviolet spectrophotometer,chronoamperometry and atomic force microscopy (AFM) . 运用X射线衍射(XRD),拉曼光谱、紫外分光光度计、计时安培分析仪和原子力显微镜(AFM)等测试手段分析了钛掺杂WO_3薄膜的结构和光学性能。
- They made spectroscopy a primary tool of chemical analysis. 他们使光谱学成为化学分析的主要工具。
- The boron-rich phase in Nd-Fe-B magnet was studied by means of HVEM, Mossbauer spectroscopy, X-ray diffraction and magnetic measurements. 本文利用1000kV超高压电镜、穆斯堡尔谱仪、X射线衍射仪和磁测量仪等对Nd-Fe-B永磁合金中的富硼相进行了研究。
- Cu(In,Ga)Se_2 thin films were characterized by energy dispersive spectroscopy (EDS),scanning electron microscopy (SEM) and X-ray diffraction (XRD). Cu(In,Ga)Se2薄膜的性能研究分别采用扫描电镜自带能谱仪(EDS)、X射线衍射(XRD)和扫描电镜分析Cu(In,Ga)Se2薄膜的化学组成、晶体结构和表面形貌。
- Photocells are also used in photometry and spectroscopy. 光电管也应用于光度学和光谱学。
- Evidently diffraction, as well as interference, is a wave property. 显然，衍射以及干涉是波特性。
