Cu(In,Ga)Se_2 thin films were characterized by energy dispersive spectroscopy (EDS),scanning electron microscopy (SEM) and X-ray diffraction (XRD).

• Cu(In,Ga)Se2薄膜的性能研究分别采用扫描电镜自带能谱仪(EDS)、X射线衍射(XRD)和扫描电镜分析Cu(In,Ga)Se2薄膜的化学组成、晶体结构和表面形貌。