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test vector file 测试向量文件
Vector File Formats include DWG, DWF, DXF, EMF, WMF, CGM, DGN, DRW, HPGL, PICT AND VEC. 向量文件格式包括DWG, DWF, DXF, EMF, WMF, CGM, DGN, DRW, HPGL, PICT 和VEC。
And this is why we design each icon size to scale, instead of relying on a single vector file. 这就是为什么我们按比例设计每一个尺寸的图标，而不是仅仅依赖一个矢量图。
A new BIST structure with the method of test vector generation based on a controlled LFSR is proposed. 摘要本文提出了一种基于受控线性反馈移位寄存器(LFSR)进行内建自测试的结构及其测试矢量生成方法。
Reason for the deletion request: Copyright violation. Copyright by Vector-Images.com. Vector file usage not allowed. 维基共享资源是一个储存自由版权作品的项目。需要你的帮助。
As to be groundwork, some applications about BST in board test, test process and test vector generation arithmetic were enforced. 在此基础上,重点讨论了边界扫描技术在板级测试领域的相关应用,并对板级测试过程和矢量生成算法进行了介绍。
This paper introduce how to according to the instruction system of 8087 co processor to develop the function test vector of 8087 on SENTRY test system. 文章介绍了如何根据8087协处理器的指令系统编写8087的测试图型,进而开出其测试程序。
The gray-scale slot is designed to write the grooves with multiple-levels along the vertical direction of grayscale-slot by a vector file that is obtained from the interface with DXF. 采用灰度狭缝进行矢量化的直写,使平台沿着垂直狭缝的方向运动,获得了具有台阶结构的光栅槽型,编写了与DXF文件一致的接口直写控制程序。
A simple test will show if this is real gold. 简单的试验就能证明这是否是真金。
This paper discusses a crosstalk delay maximization algorithm, and by using revised FAN algorithm test vectors are generated. 摘要探讨了一种串扰时延最大化算法，并且利用被修改的FAN算法，生成测试矢量。
BIST with a controlled LFSR can skip pseudo-random test vectors not contributing to the fault coverage, thus the length of test vectors and the time of test are reduced. 使用受控LFSR可以跳过伪随机测试序列中对故障覆盖率没有贡献的测试矢量，从而达到减少测试矢量长度，缩短测试时间的目的。
The experimental results show that for the circuits having many inputs,the length of test vectors generated by this method is much shorter and the hardware cost is smaller. 测试生成后，再将一维的测试向量转换成瞬态电流测试需要的测试向量对施加到被测电路。实验表明，对于输入端较多的电路，该方法生成的测试向量序列长度极大的减少，硬件开销也较小。
Study of an efficient SOC test vector compression scheme 一种有效的片上系统测试数据压缩算法
Pupils who pass the test will be promoted to the next higher grade. 小学生只要考试及格就会升到高年级。
BIST Test Vector Generator for I_(DDT) Testing 用于I_(DDT)测试的BIST测试向量生成器
He held the test tube in his hand thoughtfully. 他沉思地把试管拿在手里。
It will be wise to go over your test paper again. 还是把您的考卷再检查一遍的好。
Let us show you to see the engine to test. 让我们指给你看要测试的发动机。
He is answering the test paper busily. 他正忙着答考试卷。
This paper uses the theory of Maximal Aggressor Fault model（MAF），and discusses a crosstalk delay maximization algorithm，and generates test vectors by using revised FAN algorithm. 利用MAF模型的基本思想，探讨了一种串扰时延最大化算法，并且利用被修改的FAN算法，生成测试矢量。