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test generated tree 测试生成树
Control automatically generates tree node bindings. 控件是否自动生成树节点绑定。
The unit test generates a call to the private accessor, and then calls the private method through the private accessor. 单元测试生成对私有访问器的调用,然后通过私有访问器来调用私有方法。
On the other hand, incrementing K also increases the probability of overlapping, hindering the test generation process. 就另一方面而言，增加K块区域且增加重叠的可能性，也阻挡了测试生成过程。
A new method not requiring ring system information for finding SSSR based on generating tree, chord and path analysis is set up. 本文提出一种基于生成树、弦和路径长度的环系最小环最小集识别方法,不需事先进行环系识别。
The simulation results show that it is available to use chaotic search for I(subscript DDT) test generation. 模拟实验结果表明，将这种方法用于瞬态电流测试产生是可行的。
By using backtrace and backtrack of FAN algorithm, the efficiency of test generation algorithm has be improved. 利用了FAN算法的多路回退和回溯等主要特色，提高了测试生成算法的效率。
A simple test will show if this is real gold. 简单的试验就能证明这是否是真金。
Unit test generation does not automatically add the AspNetDevelopmentServer attribute or the TryUrlRedirection method call. 单元测试生成不会自动添加AspNetDevelopmentServer属性或TryUrlRedirection方法调用。
Low coverage indicates a process problem, which might require test generation technique to be improved, or training to be imparted to the tester. 低的覆盖率表明方法有问题，可能是测试生成技术需要改进，也可能需要给测试人员提供培训。
Bai, Andre, et.al., 1998: Fast Antirandom (FAR) Test Generation to Improve Code Coverage. Software Research Institute. SanFrancisco, CA, USA. 何淼等，1995：板齿鼠种群中长期预测的时间序列模型。走向21世纪的中国生态学。中国生态学会。
It is simple and eliminates the complicated timing issue during test generation for the crosstalk fault in the conventional approaches. 此方法简单且消除了传统方法在产生串音障碍测试图样时的复杂时间考量。
Application of inertial technology for testing general relativity II. 应用惯性技术验证广义相对论2。
In this case, the test generation procedure creates a private accessor, which enables the test assembly to access those types, both internal and private. 在这种情况下,测试生成过程将创建一个专用访问器,使测试程序集能够访问这些类型。
As the complexity of VLSI circuits and their quality requirements are increasing, theproblem of test generation is becoming more important and more difficult. 随着VLSI 电路的复杂度越来越高,对其质量要求也越来越高,因此测试生成问题也就变得更加重要,同时也变得更加困难。
The result indicates that the technology manipulates easily and is effective,the fault coverage reaches 90%,it is a feasible test generation technology. 仿真结果表明，该方法操作简单、有效，故障覆盖率达到了90%25，是一种很可行的存储器板测试生成方法。
Pupils who pass the test will be promoted to the next higher grade. 小学生只要考试及格就会升到高年级。
He held the test tube in his hand thoughtfully. 他沉思地把试管拿在手里。
It will be wise to go over your test paper again. 还是把您的考卷再检查一遍的好。
Let us show you to see the engine to test. 让我们指给你看要测试的发动机。