Two groups of nano-particle SiC prepared from different methods were examined with X-ray diffraction(XRD), small angle X-ray scattering(SAXS) and scanning electron microscope(SEM).

• 对在不同工艺下制备的两组纳米SiC颗粒分别进行了小角X射线散射(SAXS)、X射线衍射(XRD)和扫描电镜(SEM)测试.