To find out the voltage dependence on data retention lifetime, various word-line stress voltages are performed to enhance the charge gain effect of the erased-state cells.

• 我们采用了不同的字线电压来加速资料流失的过程，并藉由外加电压与资料保存生命周期的关连性，找到了一般操作条件下的资料保存生命周期。