The theory of Laser Diode life testing and mathematic model of life testing were introduced, and a high-temperature accelerating LDs automatic life testing system was developed from these.

• 文中介绍了半导体激光二极管(LD)寿命测试的理论依据,给出了寿命测试的数学模型,并据此设计了LD高温加速寿命自动测试系统。