The structure and morphology of cathode materials were characterized by Flourier-infrared spectra (FT-IR), X-ray diffractometer (XRD) and scanning electron microscope (SEM).

• 通过红外光谱(FT-IR)、 X射线衍射(XRD)和扫描电镜(SEM)等对材料的晶体结构和形貌进行表征。