The strength and fracture mechanism analysis of conducting polythiophene thin film is carried out by means of electronic speckle pattern interferometry (ESPI) and SEM observation.

• 对用电化学方法制备的导电聚噻吩薄膜材料进行了拉伸破坏实验,并用电子散斑干涉法测量了力与变形关系同时用扫描电镜对材料的断口进行了断裂机理分析。