The results of SEM, ESCA and FTP - IR - ATR analysis indicated that C - H and C - O bonds on the surface were broken up and the degree of phase separation was increased after Si ion bombardment.

• 同时用扫描电子显微镜、电子能谱化学分析和傅里叶变换红外谱对材料的分析表明:注入的Si~+打断了材料表面的一些基团,而且使材料表面变得粗化。