The part-BS PCB boards composed of BS chips and non-BS chips will exist widely for a long time, how to test these boards using boundary scan technique remains a key problem.

• 摘要由BS器件和非BS器件组装的非完全BS电路板仍在今后相当时间广泛存在，如何对它们应用边界扫描测试是板级边界扫描测试技术需要研究的关键问题。