The microstructure, phase properties and domain morphology of Si-doped PMS-PZT ceramics were investigated by using X-ray diffraction (XRD), transmission electron microscope (TEM) and energy dispersive spectrometry (EDS).

• 运用XRD、TEM、EDS等实验手段；研究了Si离子掺杂对PMS-PZT材料的相结构、微观结构以及电畴形貌的影响.