The influence of doping elements on the structural and electrochemical properties of the as-prepared samples was investigated by atomic absorption spectroscopy(AAS),X-ray diffraction(XRD),scanning electron microscope(SEM) and electrochemical experiments.

• 通过原子吸收光谱(AAS)、X射线衍射(XRD)、扫描电镜(SEM)和电化学测试等手段研究了掺杂元素对材料结构和电化学性能的影响。