The fault coverages achieved by the test generation procedures based on genetic algorithms are smaller than the deterministic test generation procedures for combinational circuits.

• 本文分析指出造成这种现象的一个可能原因在于,组合电路测试生成过程中存在高阶、长距离模式,从而导致遗传算法容易陷入局部极值或早熟收敛。