The effect of operation time on the P/P0, I-V characteristics and EL pattern was investigated. The results shown that there are two degradation modes. The slow degradation of the LEDs are due to the dark defects(DSD) grown in the action layer of LEDs.

• 文中研究了老化过程中I-V特性和I-P特性与EL图象的变化规律,并与相同结构的InP/InGaAsP双异质结发光管的退化特性进行了比较,结果表明:它们有着不同的退化机理。