The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).

• 分别用电子探针(EPMA)、X衍射(XRD)和扫描电镜(SEM)查证了其组分、相结构和显微结构的梯度分布.