The coated layer on the surface of PTW were characterized and analyzed with SEM, FTIR, XRD, and EDX.

• 利用SEM、FTIR、XRD、EDX等手段对钛酸钾晶须表面包覆层进行了表征和定量分析,并利用Zeta电位仪测试了包覆前后钛酸钾晶须的表面电荷情况。