The circuit is simulated with SMIC 0.35um 1P5M Process, and it is proved that this structure of BIST improve the precision and shorten the time of test. So the result proves that the BIST technology has advantage on the test of mixed-circuit.

• 仿真采用的工艺条件是SMIC的0.；35um 1P5M的工艺；仿真结果证明；这个BIST测试架构增加了测试精度；缩短了测试时间；从而充分体现了内建自测试在数模混合电路测试方面所具有的优越性。