The application of X-ray photoelectron spectroscopy (XPS) and X-ray auger electron spectroscopy (XAES), Scanning and Tunneling Electron Microscopy (SEM-EDX, TEM) in Interface Chemistry.

• 射线光电子能谱(XPS)和俄歇电子光谱(XAES)；扫描和透射电子显微镜(SEM-EDX；TEM)在界面化学方面的应用.