The active component characteristics of the V Cr O catalysts were investigated by means of SEM XRAS, XPS, and TPR.

• 采用显微能谱 (SEM XRAS)和X 射线光电子能谱 (XPS)方法分析了V Cr O催化剂表面活性组分的组成及状态 ,并用程序升温还原 (TPR)方法考察了催化剂活性组分的还原特征。