Results show that the UV peak intensity is enhanced as increasing annealing temperature and dopant concentration while green emission related with deep level defects is decreased.

• 结果显示,薄膜的紫外峰强度随掺杂原子分数和退火温度的提高而增强,与缺陷相关的绿光强度却随着掺杂原子分数和退火温度的提高而降低;