Objective:To observe the alteration of the neuron and neuroglial cells from injured cerebal tissue under electron microscope and to explore the state of injured cerebal tissue indirectly.
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释义
目的:观察创伤脑组织神经元和神经胶质细胞超微结构改变,间接了解脑组织受损后恢复情况。方法:常规电镜样品包埋,选区,超薄切片,透射电镜观察。
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