Nal(Tl) scintillation detector and Si(Au) surface barrier semiconductor detector are used to measure X-ray fluctuations in the HT-6B Tokamak device.

• 用NaI(Tl)晶体闪烁探测器和金硅面垒型半导体探测器,在HT-6B托卡马克装置上对X射线起伏进行了相关测量。