Microstructure of SiC/Al composite has been examined with SEM (scanning electron microscope), EDX (energy dispersive X|ray analyzer) and XRD (X|ray diffractometer).

• 采用扫描电镜(SEM)；能谱仪器(EDX)和X射线衍射仪(XRD)研究了SiCp/Al复合表面层结构.