In examining samples, we measured composition and bonding by Chemical analyzer and Raman spectrum, and measured surface by Atomic Force Microscope.

• 在试片的检测部份，我们利用了化学分析电子仪及拉曼光谱仪分析薄膜之元素组成及其键结，并且用原子力显微镜观察其表面形貌。