FIB(Focused Ion Beam) is an advanced micro/nano technology for morphological observation,sample-making for accurate positioning,compositional analysis,film deposition and maskless etching.

• 聚焦离子束(FIB)技术是一种集形貌观测、定位制样、成份分析、薄膜淀积和无掩模刻蚀各过程于一身的新型微纳加工技术。