Except for high resolving power, the design introduces more consideration to the present of silicon substrate, whose high refractive index influences the imaging process results strongly.
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释义
就设计考量上了除了要求解析度能提升外,在进行晶片反面扫瞄时,更需克服高折射系数矽基板的存在对成像品质的影响。
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