Encapsulated aluminum flakes were characterized by Scanning Electron Microscopy (SEM), EDS Energy Spectrum instrument, Infrared Spectrum (IR) , laser particle size measurer and touch angle measurer.

• 讨论了包覆二氧化硅的条件,经包膜的片状铝粉粒子通过扫描电镜、EDS能谱仪、红外光谱仪、激光粒度测试仪和接触角测定仪等分别进行了分析和表征。