DTA, XRD and SEM analysis are applied to explore the processing conditions of Solid State Reaction for Mg2Si_(1-x)Ge_x(x=0,0.2,0.4,l) .

• 应用DTA、XRD、SEM等测试手段探索了固相反应制备Mg_2Si_(1-x)Ge_x(x=0；0.；2；