Cd_(1-x)Zn_xTe crystals were prepared by the improved Bridgman method from cadmium-rich materials. The defects in the as-grown and annealed samples are investigated by positron annihilation technology in this paper.

• 用正电子湮没技术(PAT)研究了原料富Cd改进布里奇曼法生长的碲锌镉单晶样品退火前后的缺陷。