Both two tapes were made into electron microscope samples (planar view and cross section) and the microstructure was investigated with JEM?2000FX TEM (equipped with EDX) and JSM?840 SEM. ??

• 利用配有能谱的JEM?2000FX型透射电子显微镜对其进行了形貌观察和成分分析，确定了相组成。 利用JSM?840型扫描电子显微镜对多芯带材进行了低倍观察以确定其多芯带材的均匀性和生长结合的完整性。