Both substrate Auger signal and deposition layer Auger signal are used to calculate the inelastic mean free paths of Auger alectrons in potassium, and they are 0.64nm for 65 eV, 1.01nm for 256 eV and 2.20nm for 921 eV.
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铜衬底的俄歇信号和沉积层的俄歇信号均可用于计算钾薄膜中俄歇电子的IMFP;其结果为0.;64nm(65eV)、1
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