Bipolar transistors of the type of 3DD820 and 3DD15D (with F2 metal-pack) are taken as an example in the study to verify the method of controllable junction temperature.

• 以3DD820,3DD15D（F2金属封装）双极晶体管为实验对象，对结温可控的晶体管稳态工作寿命试验方法进行了验证。