At a given dose, the density is related to the dose rate and the density of the interface traps at the low dose rate is greater than that at the high dose rate.

• 结果表明：在一定的辐射剂量 下，辐射感生界面陷阱与辐射剂量率有关，低辐射剂量率较高剂量率 下辐射感生界面陷阱多；