All kinds of related properties including microscope, interface between films and Gd, compositions of the surface, and thickness of films were tested by SEM, SPM, EDX, XPS and other experimental devices.

• 运用扫描电镜(SEM)、扫描探针显微镜(SPM)、能谱仪(EDX)、X射线光电子能谱(XPS)、台阶仪等表面分析技术对镀层的微观形貌和组织、镀层与基体的界面形貌、镀层的表面成分及各组分的深度分布、薄膜厚度等进行定性分析检测。