Abstract Study on nano-meter scale observation of latent tracks induced by ions are discussed using scanning tunneling microscopy(STM) and scanning force microscopy(SFM).

• 摘要 综述了近年来用扫描隧道显微镜 (STM )和扫描力显微镜 (SFM)在原子水平上观测辐射损伤潜径迹的研究及进展。