A time-of-flight secondary ion mass spectrometer(TOF-SIMS),X-ray photoelectron spectroscopy(XPS),an atomic force microscopy(AFM),and contact angle measurements were used to characterize the monolayer.

• 使用时间飞行二次离子质谱仪(TOF-S IM S)、X射线光电子能谱仪(XPS)、原子力显微镜(AFM)和接触角测量仪对FTE自组装膜进行了表征。