A novel deterministic built-in self-test (BIST) scheme for barrel shifter embedded in 8 bits MCU datapath is proposed, and the validation is also provided.

• 摘要针对8位微控制器(MCU)数据通道中桶形移位器的可测试性问题，提出了一种新颖的确定性内置自测试(BIST)电路设计方案，并对其进行了验证。