A method in which the matrix was matched to calibration curve has been proposed for the direct determination of 13 trace impurities in high-purity tantalum pentoxide by ICP-AES.

• 摘要本文提出了基体匹配校准曲线，ICP-AES法直接测定高纯氧化钽中13种杂质元素的分析方法，并考察了光谱干扰以及基体效应的影响，确定了仪器最佳工作条件。